JPH0377543B2 - - Google Patents

Info

Publication number
JPH0377543B2
JPH0377543B2 JP57085321A JP8532182A JPH0377543B2 JP H0377543 B2 JPH0377543 B2 JP H0377543B2 JP 57085321 A JP57085321 A JP 57085321A JP 8532182 A JP8532182 A JP 8532182A JP H0377543 B2 JPH0377543 B2 JP H0377543B2
Authority
JP
Japan
Prior art keywords
speed clock
test
output
low
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57085321A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58201151A (ja
Inventor
Shigeo Kamya
Seiichi Nishio
Misao Myata
Isamu Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57085321A priority Critical patent/JPS58201151A/ja
Publication of JPS58201151A publication Critical patent/JPS58201151A/ja
Publication of JPH0377543B2 publication Critical patent/JPH0377543B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP57085321A 1982-05-20 1982-05-20 集積回路 Granted JPS58201151A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57085321A JPS58201151A (ja) 1982-05-20 1982-05-20 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57085321A JPS58201151A (ja) 1982-05-20 1982-05-20 集積回路

Publications (2)

Publication Number Publication Date
JPS58201151A JPS58201151A (ja) 1983-11-22
JPH0377543B2 true JPH0377543B2 (en]) 1991-12-10

Family

ID=13855349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57085321A Granted JPS58201151A (ja) 1982-05-20 1982-05-20 集積回路

Country Status (1)

Country Link
JP (1) JPS58201151A (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810724B2 (ja) * 1987-08-05 1996-01-31 富士通株式会社 ゲ−トアレイ及びメモリを有する半導体集積回路装置
JPH02245682A (ja) * 1989-03-18 1990-10-01 Fujitsu Ltd 半導体装置の試験装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5629177A (en) * 1979-08-16 1981-03-23 Nec Corp Semiconductor integrated circuit device
JPS5749261A (en) * 1980-09-10 1982-03-23 Nec Corp Integrated circuit device

Also Published As

Publication number Publication date
JPS58201151A (ja) 1983-11-22

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